Monitor-Based In-Field Wearout Mitigation for CMOS LC Oscillators
نویسندگان
چکیده
منابع مشابه
Phase Noise in CMOS Differential LC Oscillators
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ژورنال
عنوان ژورنال: IEEE Transactions on Device and Materials Reliability
سال: 2016
ISSN: 1530-4388,1558-2574
DOI: 10.1109/tdmr.2016.2557624